LSI testing solution

System LSI testing service

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 In recent years, a number of high-performance, multifunctional system LSIs have been developed by miniaturization of processes and development and automation of design tools. At the same time, a wide range of knowledge and high technical skill is required for test development and evaluation work of system LSI.  In addition, higher cost of corresponding test […]

LSI testing solution

Desktop Semiconductor Test Data Analysis

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Examinator-Pro™ offers product and test engineers everything they need to characterize new ICs and test programs, quickly ramp up production at OSATs and identify and diagnose yield excursions. Examinator-Pro turns standard test data files like STDF, ATDF, PCM and 100+ other formats into comprehensive reports, and enables you to drill down into the data interactively […]

LSI testing solution

Design and test environment construction tool compatible with STIL

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STILDirectorIt is a tool to build a design / test environment (design kit) compatible with international standard test description language STILReduced test development TAT with STILIn the conventional test development, the description method of test data is different in each step of test design, design verification, test program creation, test, failure analysis, and the description […]

LSI testing solution

World Leading Enterprise Strength Vector Translation Platform Since 1979

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Largest Installed BaseSince 1979, Solstice-TDS has been used by generations of test engineers.  Solstice-TDS established many standard formats and methodoglies.  WGL was Solstice-TDS’s contribution to the industry, and has been used as the primary standard test interface language by ATPG tools before STIL.  Flow-based conversion methodology has been standardized in many top electronics firms.Supported EDA […]

Design solution

Pre-Silicon Test Pattern Validation, Debug, and Re-target Solution

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Solstice-PV helps design and test teams to work in the same environment, using waveforms as the universal communication language.Scan and functional patterns (ATPG, BIST, STIL, WGL, various ATE formats), including those from IP-core vendors, can be validated with the designer’s DUT model for advanced preparation of test patterns, and more importantly, to perform early detection […]

Product

Interface for DC parametric test

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In recent years, with the increase in wafer diameter and process miniaturization, the number of devices to be measured and measurement time have increased, and the demand for lower price and higher measurement speed of parametric test system is increasing. In addition, with increasing measurement data, how to efficiently and easily process data analysis in […]

Product

Manual · Prober α 100/150/200

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Compatible with a wide range of needs for α series evaluation and analysis with comfortable operability popular Always adopting a soft contact by adopting a shock absorber. It adopts a large platen and realizes mounting of a margin manipulator. Moreover, it is possible to adjust Z of the needle at once by moving the platen […]