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Peripheral package IC test socket

Posted webmaster

JF Microtechnology offers a range of test sockets for various lead / leadless packages that emphasize OEE (equipment overall efficiency) in IC / LSI production. It adopts its own contact pin and housing structure and covers a wide range from evaluation to mass production such as high current / Kelvin test and high frequency analog test.

Zigma

- Micro wipe
- Broadband to 40 GHz

Alpha

Alpha™: High current/power test contacting solutions which long mechanical life ensures reliable repeatable electrical and mechanical performance over multiple cycles.

Gamma

Gamma™: High current/power test contacting solutions which long mechanical life ensures reliable repeatable electrical and mechanical performance over multiple cycles.

Eta.5

Eta.5™ products are the next best thing of not having a contact at all. The high electrical performance and long mechanical life ensures reliable repeatable electrical and mechanical performance over multiple cycles.