yieldHUB is a cloud-based yield management system used by fabless companies, IDMs, and OSATs around the world. yieldHUB offers a cost-effective solution by combining semiconductor test expertise and analytical technology with ever evolving cloud-based solutions. The data model is scalable from one Wafer to several lots and several MB to several TB. All you have […]
JF Microtechnology offers a range of test sockets for various lead / leadless packages that emphasize OEE (equipment overall efficiency) in IC / LSI production. It adopts its own contact pin and housing structure and covers a wide range from evaluation to mass production such as high current / Kelvin test and high frequency analog […]
LitePoint’s innovative products for manufacturing were built for just that…the rigors and unique demands of testing complex wireless devices at high volumes in manufacturing. Delays cost time and time costs money. From rugged, battle-proven hardware, to software with easy-to-read results display and logging, LitePoint systems are designed from the ground up for high-volume production.IQxel Family（Test Solutions for Manufacturing） […]
LitePoint’s innovative products for manufacturing were built for just that…the rigors and unique demands of testing complex wireless devices at high volumes in manufacturing. Delays cost time and time costs money. From rugged, battle-proven hardware, to software with easy-to-read results display and logging, LitePoint systems are designed from the ground up for high-volume production.
We are designing / manufacturing / selling the tester interface with accumulated technical capabilities through various tester application development for many years and sales related to tester interface. HiFix
At-Speed Protocol Verification of Display Packet Transmissions Running on MIPI Physical LayersHighly sophisticated capture and analysis tools are embedded within the Introspect ESP Software and operated on the SV3C CPRX C-PHY Analyzer. The tools enable gaining insight into frame transmissions, DCS commands, and display panel configuration. Frame viewer provides a global view of DSI-2 captures […]
While translating ATPG patterns (WGL and STIL formats) is a push-button operation using Solstice-TDS, converting Verilog simulation output (VCD and EVCD) to a tester format involves a process called cyclization. This process creates cycle-based timing from the event-based VCD/EVCD file. With Solstice TimeTable, signals, directions, test period, per-pin timing, and ATE format are all automatically […]
The QD-10xx is a full featured, advanced configurable quiescent supply current (IDDQ) measurement instrument, supporting both probe and final test and designed for probe card and interface board applications. The instrument supports a wide range of IDDQ test and measurements applications and provides digital measurement values as well as a pass/fail output signal. On-board memory […]
OverviewWe provide test program creation environment centering on SIF language adopted by Tester T66xx / T65xx series manufactured by ADVANTEST CORPORATION.You can read, modify and save existing SIF.Since the test program flow and the Pin state in each test can also be displayed in a list, it is convenient for data summarization, verification and reporting.By […]
National Instruments’ NI LabVIEW is a graphical program development environment for measurement control systems. Using NI LabVIEW, we will develop application software that connects and controls multiple instruments with GPIB and performs semiconductor testing with low cost and short delivery time.CharacteristicParameter setting, graphic operation using selection, buttons, sliders, etc.GPIB control of multiple measuring instruments, measurement, […]
